Publications using UCLA SIMS Data

389 V. S. Heber, K. D. McKeegan, D. S. Burnett, J. Duprat, Y. Guan, A. Jurewicz, C. T. Olinger, S. P. Smith (2014) Accurate analysis of shallowly implanted solar wind ions by SIMS backside depth profiling. Chemical Geology 390, 61‐73 doi:10.1016/j.chemgeo.2014.10.003.    [pdf] summary

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N 34° 4' 9" W 118° 26' 27"